Systems, methods and apparatus to calibrate a solid state...

Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system

Reexamination Certificate

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Reexamination Certificate

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07138636

ABSTRACT:
Systems, methods and apparatus are provided through which a solid-state X-Ray detector is electronically scrubbed and a flat-field X-Ray exposure of the solid-state X-Ray detector is simulated in reference to an adjusted bias of the solid-state X-Ray detector. The simulation yields a gain image of the solid-state X-Ray detector which is in turn suitable for calibrating the solid-state X-Ray detector without projecting an X-Ray beam onto the solid-state X-Ray detector.

REFERENCES:
patent: 5693948 (1997-12-01), Sayed et al.
patent: 5920070 (1999-07-01), Petrick et al.
patent: 6115461 (2000-09-01), Boudry et al.
patent: 6127684 (2000-10-01), Kaifu
patent: 6504895 (2003-01-01), Dixon et al.
patent: 2006/0011853 (2006-01-01), Spartiotis et al.

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