Systems for variable reading in non-volatile memory

Details Systems for variable reading in non-volatile memory Systems for variable reading in non-volatile memory

2007-06-28

2009-02-10

Nguyen, Dang T (Department: 2824)

Static information storage and retrieval

Floating gate

Multiple values

C365S185180, C365S185140

Reexamination Certificate

active

07489542

ABSTRACT:
Systems and methods in accordance with various embodiments can provide for reduced program disturb in non-volatile semiconductor memory. In one embodiment, select memory cells such as those connected to a last word line of a NAND string are programmed using one or more program verify levels or voltages that are different than a corresponding level used to program other cells or word lines. One exemplary embodiment includes using a lower threshold voltage verify level for select physical states when programming the last word line to be programmed for a string during a program operation. Another embodiment includes applying a lower program voltage to program memory cells of the last word line to select physical states. Additional read levels are established for reading the states programmed using lower verify levels in some exemplary implementations. A second program voltage step size that is larger than a nominal step size is used in one embodiment when programming select memory cells or word lines, such as the last word line to be programmed for a NAND string.

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