Systems for testing a plurality of circuit devices

Details Systems for testing a plurality of circuit devices Systems for testing a plurality of circuit devices

2005-09-13

2005-09-13

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100

Reexamination Certificate

active

06943576

ABSTRACT:
A test system that tests first through m-th circuit devices for defects. The test system includes a controller and first through m-th control circuits. The controller is configured to generate a test signal having information for testing first through m-th circuit devices. The first through m-th control circuits are each configured to test a respective one of the first through m-th circuit devices for a defect using the test signal, and to stop testing the respective one of the first through m-th circuit devices when a defect is identified.

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patent: 6784685 (2004-08-01), Chao et al.

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