Dynamic magnetic information storage or retrieval – Checking record characteristics or modifying recording...
Reexamination Certificate
2007-04-24
2007-04-24
Tsai, Carol S. W. (Department: 2857)
Dynamic magnetic information storage or retrieval
Checking record characteristics or modifying recording...
C702S069000, C360S031000, C360S053000, C360S066000, C360S068000, C360S069000, C360S078040, C360S078060
Reexamination Certificate
active
10172515
ABSTRACT:
The thermal decay of data written to a magnetic mass storage medium is determined by measuring and analyzing the time-domain equalized-signal-to-noise ratio (ESNR) and equalized signal-to-total-distortion noise ratio (ESTDR) of written data. In some embodiments, a test track and a reference track are initialized from data. Subsequently, the reference track is re-initialized from the test data, and the time-domain ESNR and/or ESTDR measurements are made of the test track and the reference track, at predetermined time intervals. Later, the time-domain ESNR and ESTDR measurements are analyzed to determine the thermal decay of the data written. In another embodiment of the present invention, the ESNR and/or ESTDR measurements includes reading the data through a non-return-to-zero bus in phases, in which the phases are selected in sequence.
REFERENCES:
patent: 4905102 (1990-02-01), Schulz
patent: 5555279 (1996-09-01), Nir et al.
patent: 5721816 (1998-02-01), Kusbel et al.
patent: 5754353 (1998-05-01), Behrens et al.
patent: 6091541 (2000-07-01), Yoon
patent: 6097535 (2000-08-01), Terahara
patent: 6144937 (2000-11-01), Ali
patent: 6185175 (2001-02-01), Zook
patent: 6236628 (2001-05-01), Kim
patent: 6338148 (2002-01-01), Gillenwater et al.
patent: 6359744 (2002-03-01), Mallary
patent: 6493162 (2002-12-01), Fredrickson
patent: 6504662 (2003-01-01), Sobey
patent: 6687205 (2004-02-01), Huber
patent: 6775521 (2004-08-01), Chen
patent: 6937650 (2005-08-01), Coker et al.
patent: 2002/0128787 (2002-09-01), Seng et al.
patent: 2002/0186493 (2002-12-01), Yamamoto
Kan UttHeng
Seng Edmun Chian Song
Seagate Technology LLC
Shumaker & Sieffert P.A.
Tsai Carol S. W.
LandOfFree
Systems, apparatus, and methods to determine thermal decay... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Systems, apparatus, and methods to determine thermal decay..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems, apparatus, and methods to determine thermal decay... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3768374