Systems and methods to measure banding print defects

Details Systems and methods to measure banding print defects Systems and methods to measure banding print defects

2011-06-21

2011-06-21

Park, Chan S (Department: 2625)

Facsimile and static presentation processing

Static presentation processing

C347S129000, C347S247000, C347S255000, C358S001120, C358S406000, C358S448000, C399S009000, C399S049000

Reexamination Certificate

active

07965397

ABSTRACT:
A defect once around signal time period of a defect source inherent in a marking device is determined, the defect source having one or more banding frequencies. A reference scanline time delay, which is a time between a page sync signal and a writing of a reference scanline, is determined. A test target is written, sensed and analyzed. A reference scanline phase offset of each banding frequency relative to the reference scanline is determined. A banding phase of each banding frequency is determined based at least on the defect once around signal time period, reference scanline time delay and reference scanline phase offset.

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