Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2006-06-20
2006-06-20
Gandhi, Jayprakash N. (Department: 2125)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S121000, C702S084000
Reexamination Certificate
active
07065424
ABSTRACT:
This invention introduces systems and methods that control production process quality, wherein the production process has a plurality of durable items, each durable item is associated with a re-qualification process initiated as a function of a life expectancy associated therewith. The life expectancy associated with each durable item is reset upon completion of the associated re-qualification process. An exemplary method comprises (I) monitoring re-qualification indicia associated with each associated re-qualification process, and (ii) controlling availability of re-qualified durable items of the production process as a function of the re-qualification indicia to thereby control production process quality.
REFERENCES:
patent: 5432702 (1995-07-01), Barnett
patent: 5548535 (1996-08-01), Zvonar
patent: 5591299 (1997-01-01), Seaton et al.
patent: 5726920 (1998-03-01), Chen et al.
patent: 5740429 (1998-04-01), Wang et al.
patent: 5751581 (1998-05-01), Tau et al.
patent: 5761064 (1998-06-01), La et al.
patent: 5886896 (1999-03-01), Lantz et al.
patent: 5896294 (1999-04-01), Chow et al.
patent: 5914879 (1999-06-01), Wang et al.
patent: 5972727 (1999-10-01), Ryan et al.
patent: 6035245 (2000-03-01), Conboy et al.
patent: 6035293 (2000-03-01), Lantz et al.
patent: 6108585 (2000-08-01), Ryan et al.
patent: 6156580 (2000-12-01), Wooten et al.
patent: 6163801 (2000-12-01), O'Donnell et al.
patent: 6174738 (2001-01-01), Steffan et al.
patent: 6216948 (2001-04-01), Conboy et al.
patent: 6223203 (2001-04-01), O'Donnell et al.
patent: 6282613 (2001-08-01), Hsu et al.
patent: 6308107 (2001-10-01), Conboy et al.
patent: 6424876 (2002-07-01), Cusson et al.
patent: 6449522 (2002-09-01), Conboy et al.
patent: 6480877 (2002-11-01), O'Donnell et al.
patent: 6546523 (2003-04-01), Boorananut et al.
patent: 6597973 (2003-07-01), Barich et al.
patent: 6646660 (2003-11-01), Patty
patent: 2002/0143601 (2002-10-01), Sinex
Logsdon George
MacDonald William
Rust Darren Lee
Gandhi Jayprakash N.
National Semiconductor Corporation
LandOfFree
Systems and methods that monitor re-qualification indicia... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Systems and methods that monitor re-qualification indicia..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems and methods that monitor re-qualification indicia... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3670931