Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate
2007-01-09
2007-01-09
Cygan, Michael T. (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
Reexamination Certificate
active
11134170
ABSTRACT:
Systems and methods of measuring residual stress are disclosed. In one embodiment, a method of measuring residual stress in a material under test includes directing radiation onto a stressed material and detecting the resulting diffraction peaks to measure known residual stress of a control specimen, inducing and sensing magnetoelastic interactions onto the control specimen, developing an empirical database of the diffraction and magnetoelastic interaction measurements of the control specimen, inducing and measuring magnetoelastic interactions on a material under test, and correlating the empirical database to the magnetoelastic interaction outputs from the material under test.
REFERENCES:
patent: 4095103 (1978-06-01), Cohen et al.
patent: 4528856 (1985-07-01), Junker et al.
patent: 4686631 (1987-08-01), Ruud
patent: 4706020 (1987-11-01), Viertl et al.
patent: 4856326 (1989-08-01), Tsukamoto
patent: 4893079 (1990-01-01), Kustra et al.
patent: 5055784 (1991-10-01), Jaeger et al.
patent: 5184071 (1993-02-01), Tasca
patent: 5610515 (1997-03-01), Soules
patent: 5616857 (1997-04-01), Merck, Jr. et al.
patent: 5666051 (1997-09-01), Junker et al.
patent: 5898302 (1999-04-01), Soules
patent: 6142010 (2000-11-01), Merck, Jr. et al.
patent: 6247355 (2001-06-01), Suresh et al.
patent: 6247356 (2001-06-01), Merck, Jr. et al.
patent: 6583618 (2003-06-01), McClelland
patent: 6718820 (2004-04-01), Kwon et al.
patent: 6727690 (2004-04-01), Soules
patent: 6851300 (2005-02-01), Kwon et al.
Cygan Michael T.
Davis Octavia
Lee & Hayes PLLC
The Boeing Company
LandOfFree
Systems and methods of measuring residual stress in metallic... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Systems and methods of measuring residual stress in metallic..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems and methods of measuring residual stress in metallic... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3814529