Systems and methods of allocating device testing resources...

Details Systems and methods of allocating device testing resources... Systems and methods of allocating device testing resources...

2007-10-09

2007-10-09

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

11035580

ABSTRACT:
Systems and methods of allocating device testing resources are described. In one aspect, a system for allocating m resources for testing devices to n sites of a probe card configured to electrically connect to respective test site locations on a substrate, where m and n are integers and m<n, is described. The system includes a configurable interconnection network that includes a plurality of connections between resources and the probe card sites. The connections enable each test site location to be connected to at least one of the resources over a minimum number of touchdowns of the probe card onto the test sites. Each of the resources is connectable to at most a number of the probe card sites equal to the minimum number of touchdowns. A method of allocating m resources for testing devices to n sites of a probe card configured to electrically connect to respective test site locations on a substrate, where m and n are integers and m<n, also is described.

REFERENCES:
patent: 5124636 (1992-06-01), Pincus et al.
patent: 5323107 (1994-06-01), D'Souza
patent: 5506510 (1996-04-01), Blumenau
patent: 5657394 (1997-08-01), Schwartz et al.
patent: 5736850 (1998-04-01), Legal
patent: 5797114 (1998-08-01), Roberts et al.
patent: 6072190 (2000-06-01), Watanabe et al.
patent: 6113646 (2000-09-01), Holden
patent: 6157185 (2000-12-01), Stone et al.
patent: 6300786 (2001-10-01), Doherty et al.
patent: 6466047 (2002-10-01), Doherty et al.
patent: 6677776 (2004-01-01), Doherty et al.
patent: 6731127 (2004-05-01), Watts
patent: 6853211 (2005-02-01), Doherty et al.
patent: 6856150 (2005-02-01), Sporck et al.
patent: 2003/0221152 (2003-11-01), Volkerink et al.

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