Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-04-25
2006-04-25
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S521000
Reexamination Certificate
active
07034949
ABSTRACT:
A wavefront measuring system and method for detecting phase aberrations in wavefronts that are reflected from, transmitted through or internally reflected within objects sought to be measured, e.g., optical systems, the human eye, etc. includes placing a reticle in the path of a return beam from the object, and placing a detector at a diffraction pattern self-imaging plane relative to the reticle. The diffraction pattern is analyzed and results in a model of the wavefront phase characteristics. A set of known polynomials is fitted to the wavefront phase gradient to obtain polynomial coefficients that describe aberrations in the object or within the wavefront source being measured.
REFERENCES:
patent: 4105302 (1978-08-01), Tate, Jr.
patent: 4711576 (1987-12-01), Ban
patent: 5062702 (1991-11-01), Bille
patent: 5080477 (1992-01-01), Adachi
patent: 5164750 (1992-11-01), Adachi
patent: 5528321 (1996-06-01), Blum et al.
patent: 5777719 (1998-07-01), Williams et al.
patent: 5898479 (1999-04-01), Hubbard et al.
patent: 5929970 (1999-07-01), Mihashi
patent: 5949521 (1999-09-01), Williams et al.
patent: 5963300 (1999-10-01), Horwitz
patent: 6007204 (1999-12-01), Fahrenkrug et al.
patent: 6050687 (2000-04-01), Bille et al.
patent: 6086204 (2000-07-01), Magnante
patent: 6095651 (2000-08-01), Williams et al.
patent: 6112114 (2000-08-01), Dreher
patent: 6120150 (2000-09-01), Sarver et al.
patent: 6155684 (2000-12-01), Bille et al.
patent: 6199986 (2001-03-01), Williams et al.
patent: 6234631 (2001-05-01), Sarver et al.
patent: 6256098 (2001-07-01), Rubinstein et al.
patent: 6257723 (2001-07-01), Sarver et al.
patent: 6270221 (2001-08-01), Liang et al.
patent: 6271915 (2001-08-01), Frey et al.
patent: 6299311 (2001-10-01), Williams et al.
patent: 6305802 (2001-10-01), Roffman et al.
patent: 6309068 (2001-10-01), Kohayakawa
patent: 6338559 (2002-01-01), Williams et al.
patent: 6379005 (2002-04-01), Williams et al.
patent: 6379008 (2002-04-01), Chateau et al.
patent: 6382795 (2002-05-01), Lai
patent: 6394605 (2002-05-01), Campin et al.
patent: 6396588 (2002-05-01), Sei
patent: 6460997 (2002-10-01), Frey et al.
patent: 6499843 (2002-12-01), Cox et al.
patent: 6550917 (2003-04-01), Neal et al.
patent: 6554429 (2003-04-01), Campin et al.
patent: 6573997 (2003-06-01), Goldberg et al.
patent: 6607274 (2003-08-01), Stantz et al.
patent: 6781681 (2004-08-01), Horwitz
patent: 2001/0033362 (2001-10-01), Sarver
patent: 2001/0035939 (2001-11-01), Mihashi et al.
patent: 2001/0041884 (2001-11-01), Frey et al.
patent: 2002/0047992 (2002-04-01), Graves et al.
patent: 2002/0122153 (2002-09-01), Piers et al.
patent: 2002/0140902 (2002-10-01), Guirao et al.
patent: 2002/0167643 (2002-11-01), Youssefi
patent: 2002/0186346 (2002-12-01), Stantz et al.
patent: 2002/0196412 (2002-12-01), Abitbol
patent: 2003/0011745 (2003-01-01), Molebny et al.
patent: 2003/0151721 (2003-08-01), Lai et al.
patent: 1 153 570 (2001-11-01), None
patent: WO 92/01417 (1992-02-01), None
patent: WO 98/27863 (1998-07-01), None
patent: WO-99/66308 (1999-12-01), None
patent: WO 00/10448 (2000-03-01), None
patent: WO 00/19885 (2000-04-01), None
patent: WO 01/47449 (2001-07-01), None
patent: WO 01/058339 (2001-08-01), None
patent: WO 01/82791 (2001-11-01), None
patent: WO 01/89424 (2001-11-01), None
patent: WO 02/09579 (2002-02-01), None
patent: WO 02/19901 (2002-03-01), None
patent: WO 02/28272 (2002-04-01), None
patent: WO 02/30273 (2002-04-01), None
patent: WO 03/009746 (2003-02-01), None
Platt et al., “History and Principles of Shack-Hartmann Wavefront Sensing,” Journal of Refractive Surgery, vol. 17, Sep./Oct. 2001.
Hiroshi Ohba,Wavefront Sensor Using a 2-Dimensional Diffraction Grating, Japanese Journal of Applied Physics,vol. 37, 1998, pp. 3749-3753.
U.S. Appl. No. 10/014,037, filed Dec. 10, 2001, entitled System and Method for Wavefront Measurement.
Junzhong Liang et al.,Objective measurement of wave aberrations of the human eye with the use of a Hartmann-Shack wave-front sensor, Journal of Optical Society of America,vol. 11, No. 7, Jul. 1994, pp. 1949-1957.
Brian A. Barsky et al.,Incorporating Camera Models, Ocular Models, and Actual Patient Eye Data for Photo-Realistic and Vision-Realistic Rendering,Fifth Int'l. Conf. on Mathematical Methods for Curves and Surfaces, Oslo, Jun. 29, 2000, “Mathematical Methods in CAGD,” Vanderbilt University Press, Nashville, 2001 pp. 1-10.
Patrick P. Naulleau et al.,Extreme ultraviolet carrier-frequency shearing interferometry of a lithographic four-mirror optical system, Journal of Vacuum Science Technology,vol. B 18, No. 6, Nov./Dec. 2000, pp. 2939-2943.
Helen L. Kung,Micro-optical wavelength detectors,http://clynlish.stanford.edu/˜hlkung/research.html, printed Jun. 9, 2003, 3 pages.
SPIEWeb Scholarly Journals,Optical Engineering,vol. 38, No. 12, Dec. 1999, http://www.spie.org/web/journals/oe/oedec99.html, printed Jun. 9, 2003, 8 pages.
U.S. Appl. No. 10/653,552, filed Sep. 2, 2003.
Supplementary European Search Report for EP 02 79 7270, mailed on Feb. 9, 2005, 3 pages.
Lee Hwa (Andrew)
Morrison & Foerster / LLP
Ophthonix, Inc.
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