Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-02-22
2005-02-22
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C702S117000, C714S733000
Reexamination Certificate
active
06859059
ABSTRACT:
Methods for testing integrated circuits (ICs) are provided. An exemplary method, in which the IC has a first pad configured as a signal interface for components external to the IC, the first pad having a receiver configured to receive an input signal from a component external to the IC, comprises: electrically interconnecting automated test equipment (ATE) with the IC; providing at least one stimulus to the IC such that the IC measures a receiver termination characteristic of the first pad; and receiving information corresponding to the receiver termination characteristic of the first pad. Systems and integrated circuits also are provided.
REFERENCES:
patent: 5117129 (1992-05-01), Hoffman et al.
patent: 5682392 (1997-10-01), Raymond et al.
patent: 5796260 (1998-08-01), Agan
patent: 5977775 (1999-11-01), Chandler et al.
patent: 6275962 (2001-08-01), Fuller et al.
patent: 6324485 (2001-11-01), Ellis
patent: 6365859 (2002-04-01), Yi et al.
patent: 6396279 (2002-05-01), Gruenert
patent: 6397361 (2002-05-01), Saitoh
patent: 6448865 (2002-09-01), Miller
patent: 6556938 (2003-04-01), Rohrbaugh et al.
patent: 6577980 (2003-06-01), Shepston et al.
patent: 6658613 (2003-12-01), Rearick et al.
Haulin, Tord, “Built-in Parametric Test for Controlled Impedance I/Os,” Ericsson Telecom, pp. 123-128, no month/year.
Niggerneyer, et al., “Parametric Built-In Self-Test of VLSI Systems,” Laboratory for Information Technology, (3 pages), no month/year.
Rearick Jeffrey R.
Rohrbaugh John G.
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