Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-03-29
2011-03-29
Wachsman, Hal D (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S079000, C702S117000, C702S118000, C702S125000, C714S718000, C714S731000
Reexamination Certificate
active
07917319
ABSTRACT:
Delay-fault testing and parametric analysis systems and methods utilizing one or more variable delay time-base generators. In embodiments of the delay-fault testing systems, short-delay logic paths are provided with additional scan-chain memory elements and logic that, in conjunction with the one or more variable-delay time-base generators, provides the effect of over-clocking without the need to over-clock. Related methods provide such effective over-clocking. In embodiments of parametric analysis systems, test point sampling elements and analysis circuitry are clocked as a function of the output of the one or more variable-delay time-base generators to provide various parametric analysis functionality. Related methods address this functionality.
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DFT Microsystems Inc.
Downs Rachlin & Martin PLLC
Wachsman Hal D
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