Systems and methods for test time outlier detection and...

Details Systems and methods for test time outlier detection and... Systems and methods for test time outlier detection and...

2011-06-28

2011-06-28

Patel, Paresh (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07969174

ABSTRACT:
Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

REFERENCES:
patent: 4639664 (1987-01-01), Chiu et al.
patent: 4916435 (1990-04-01), Fuller
patent: 5386189 (1995-01-01), Nishimura et al.
patent: 5477544 (1995-12-01), Botelho
patent: 5539325 (1996-07-01), Rostoker et al.
patent: 5726920 (1998-03-01), Chen et al.
patent: 5736850 (1998-04-01), Legal
patent: 5996099 (1999-11-01), Fournel et al.
patent: 6055463 (2000-04-01), Cheong et al.
patent: 6246250 (2001-06-01), Doherty et al.
patent: 6366109 (2002-04-01), Matsushita
patent: 6377901 (2002-04-01), List et al.
patent: 6618682 (2003-09-01), Bulaga et al.
patent: 6751763 (2004-06-01), Cho
patent: 6788993 (2004-09-01), Beffa
patent: 6792373 (2004-09-01), Tabor
patent: 6792386 (2004-09-01), Dobson
patent: 6842022 (2005-01-01), Khoche
patent: 6936889 (2005-08-01), Koga et al.
patent: 6937049 (2005-08-01), Wuidart et al.
patent: 6948149 (2005-09-01), Goodwin
patent: 6988232 (2006-01-01), Ricchetti et al.
patent: 7013231 (2006-03-01), Kritt
patent: 7197417 (2007-03-01), Pramanick et al.
patent: 7208969 (2007-04-01), Golan
patent: 2004/0044938 (2004-03-01), Heo
patent: 2005/0278597 (2005-12-01), Miguelanez et al.
patent: 2006/0085155 (2006-04-01), Miguelanez et al.
patent: 2006/0100844 (2006-05-01), Yang et al.
patent: 2006/0106555 (2006-05-01), Voorakaranam et al.
patent: 2002/311775 (2002-10-01), None
patent: 2003/197697 (2003-07-01), None

Affiliated with

Also associated with

Rating

Systems and methods for test time outlier detection and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Systems and methods for test time outlier detection and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems and methods for test time outlier detection and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2639310