Systems and methods for sensor-level machine monitoring

Details Systems and methods for sensor-level machine monitoring Systems and methods for sensor-level machine monitoring

2008-10-07

2011-11-01

Mehmood, Jennifer (Department: 2612)

Communications: electrical

Condition responsive indicating system

Specific condition

C340S680000, C340S682000, C173S020000

Reexamination Certificate

active

08049637

ABSTRACT:
According embodiments of the invention, systems and methods for sensor-level machine monitoring are provided. In one example embodiment, there is disclosed a system for monitoring a machine. The system may include a first sensor including a first processor and a second sensor including a second processor. The system may further include a communication trunk in communication with the first sensor and the second sensor, and operable to communicate sensor data between each of the first processor and the second processor. The first sensor and the second sensor are operable to generate sensor data associated with at least one machine condition. Further, at least one of the first processor or the second processor is operable to analyze sensor data generated by each of the first sensor and the second sensor and determine at least one machine fault based at least in part on the sensor data.

REFERENCES:
patent: 5528219 (1996-06-01), Frohlich et al.
patent: 7019661 (2006-03-01), Misato
patent: 7496477 (2009-02-01), Misra et al.
patent: 7668670 (2010-02-01), Lander
patent: 7688218 (2010-03-01), LeFebvre et al.
patent: 7719416 (2010-05-01), Arms et al.
patent: 2002/0171555 (2002-11-01), Kochersberger et al.
patent: 2006/0145881 (2006-07-01), Sakatani et al.
patent: 2007/0063859 (2007-03-01), Twerdochlib et al.
patent: 2007/0111790 (2007-05-01), Maekawa et al.
patent: 2008/0001772 (2008-01-01), Saito
patent: 2008/0074254 (2008-03-01), Townsend et al.
patent: 2008/0097725 (2008-04-01), Knodle et al.

Affiliated with

Also associated with

Rating

Systems and methods for sensor-level machine monitoring does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Systems and methods for sensor-level machine monitoring, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems and methods for sensor-level machine monitoring will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4300299