Systems and methods for self test for a slowly varying sensor

Details Systems and methods for self test for a slowly varying sensor Systems and methods for self test for a slowly varying sensor

2006-04-25

2006-04-25

Raevis, Robert (Department: 2856)

Measuring and testing

Instrument proving or calibrating

Speed, velocity, or acceleration

Reexamination Certificate

active

07032430

ABSTRACT:
Systems, methods and circuits for implementing a self test in a slowly varying sensor. In one particular case, a circuit is provided that includes two filters operating in parallel. One of the filters is tailored for filtering normal operational signals, and operates at a first oversampling rate. The other filter is tailored for filtering test signals, and operates at a second oversampling rate. The second oversampling rate is generally less than the first oversampling rate. In various cases, the filter tailored for filtering normal operational signals may be programmed for operation across a plurality of oversampling rates.

REFERENCES:
patent: 5900529 (1999-05-01), Hanisko et al.
patent: 2005/0038623 (2005-02-01), Hammerschmidt
patent: 2005/0183489 (2005-08-01), Weinberg et al.
U.S. Appl. No. 10/749,655, filed Dec. 31, 2003, Pitz et al.
Brandt, Brian P., “Oversampled Analog-To-Digital Conversion Conversion.” Integrated Circuits Laboratory. 1991; pp. 101-137 and p. 156 (reference). Ch. 6.

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