Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2004-12-16
2009-06-30
Desire, Gregory M (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C345S421000, C345S441000, C345S582000, C345S619000, C345S653000, C356S601000, C382S106000, C382S154000, C382S199000
Reexamination Certificate
active
07555163
ABSTRACT:
A system and method for implicitly computing signed distance values in a graphics application. In one embodiment, rather than storing numerous distance values along a given raster scan line, only two values are stored for each interval defining the intersection of the raster scan line with the shape. These two values represent the interior of the object to be rendered along a given grid line. In another embodiment each grid line may be parameterized (e.g., from 0 to 1). Each intersection interval may then be represented by the parameter value at an entry point of the surface and an exit point of the surface, along the given grid line.
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Marino Sebastian Mark
Neto Murilo Gondim Coutinho
Crowell & Moring LLP
Desire Gregory M
Sony Corporation
Sony Pictures Entertainment Inc.
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