Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2007-04-23
2009-12-29
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S170000, C327S512000
Reexamination Certificate
active
07637658
ABSTRACT:
Various systems and methods for pulse width modulated clocking in a temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems with a variable current source, a transistor, and a pulse width modulation circuit. The variable current source is operable to provide a first current and a second current that are applied to the transistor. A first base-emitter voltage occurs on the transistor when the first current is applied, and a second base-emitter voltage occurs on the transistor when the second current is applied. The first base emitter voltage is associated with a first sample period, and a second base-emitter voltage is associated with a second sample period. The pulse width modulation circuit provides a pulse width modulated clock including a combination of the aforementioned first period and second period.
REFERENCES:
patent: 4165642 (1979-08-01), Lipp
patent: 5195827 (1993-03-01), Audy
patent: 5867012 (1999-02-01), Tuthill
patent: 5982221 (1999-11-01), Tuthill
patent: 6097239 (2000-08-01), Miranda, Jr. et al.
patent: 6133753 (2000-10-01), Thomson et al.
patent: 6169442 (2001-01-01), Meehan et al.
patent: 6407618 (2002-06-01), Taft et al.
patent: 7193543 (2007-03-01), McLeod et al.
patent: 2007/0091979 (2007-04-01), Chiu
Analog Devices Data Sheet, 10-Bit Temperature Sensor (AD7416) and Four Single ADCs (AD7417/AD7418), 2004, printed from www.analog.com Apr. 10, 2007.
Analog Devices Data Sheet TMP401, Low Power Programmable Temperature Controller, 2002, printed from www.analog.com Apr. 10, 2007.
Texas Instruments Data Sheet TMP401, +/−1C Programmable Remote/Local Digital Out Temperature Sensor, Aug. 2006, printed from www.ti.com Apr. 10, 2007.
Doorenbos et al., Texas Instruments Data Sheet TMP411, +/−1C Remote and Local Temperature Sensor with N-Factor and Series Resistance Correction, Feb. 2007.
SMSC Data Sheet, EMC1023 1C Triple Temperature Sensor with Resistance Error Correction, Dec. 3, 2004.
U.S. Appl. No. 11/738,566, filed Apr. 23, 2007, Doorenbos et al.
U.S. Appl. No. 11/738,584, filed Apr. 23, 2007, Gardner et al.
U.S. Appl. No. 11/738,595, Apr. 23, 2007. Doorenbos et al.
Analog Devices Data Sheet, +/− 1 C Remote and Local System Temperature Monitor (ADM1032), 2005, printed from analog.com, May 24, 2007.
Analog Devices Data Sheet, +/− C Temperature Monitor with Series Resistance Cancellation (ADT7461), 2005, printed from analog.com, May 24, 2007.
Maxim Data Sheet, Remote/Local Temperature Sensor with SMBus Serial Interface, (MAX1617A), Jan. 1999, printed from www.maxim-ic.com, May 24, 2007.
Pertijs et al. “A Cmos Smart Temperature Sensor” IEEE J. Solid-State Circuits, vol. 40, No. 12, Dec. 2005.
SMSC Data Sheet 1 Degree D Triple SMbus Sensor with Resistance Error Correction, (EMC1033), Jan. 2007, printed from www.smsc.com.
Doorenbos Jerry L.
Gardner Marco A.
Brady III Wade J.
Jagan Mirellys
Patti John J.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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