Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-03-29
2005-03-29
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S074000, C702S189000
Reexamination Certificate
active
06873923
ABSTRACT:
Representative embodiments are directed to systems and methods for processing analyzer trace data of a multi-tone signal to more accurately estimate the frequencies and amplitudes of the tones of the multi-tone signal. Specifically, trace data may be processed to determine peak trace points. For each identified peak point, an error minimization algorithm minimizes the sum of differences between a plurality of trace points surrounding the respective peak point and the predicted Fourier transform through a raised-cosine window of a theoretical tone. The result of the minimization algorithm identifies the amplitude and frequency of a tone of the multi-tone signal with appreciable degree of accuracy.
REFERENCES:
patent: 5475315 (1995-12-01), Cabot
patent: 5649304 (1997-07-01), Cabot
patent: 10131251 (2003-01-01), None
Press, William H. et al, “Numerical Recipes in C The Art of Scientific Computing”, Cambridge University Press, 1988, pp. 2 cover pages and 408-412.
Agilent Technologie,s Inc.
Bui Bryan
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