Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate
2005-12-20
2008-11-25
Barbee, Manuel L (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
C702S180000, C073S061710, C377S011000, C377S012000, C377S019000
Reexamination Certificate
active
07457709
ABSTRACT:
Systems and methods consistent with embodiments of the present invention provide a method for the measurement and analysis of particle counts in flow cytometry and hematology instruments. In some methods for the measurement and analysis of particle counts, a corrected histogram of particle distributions is calculated and used to obtain an accurate count of particles and an accurate measurement of other particle parameters.
REFERENCES:
patent: 3530381 (1970-09-01), Klein et al.
patent: 5633945 (1997-05-01), Kamentsky
patent: 6744245 (2004-06-01), Taylor et al.
patent: 2003/0020447 (2003-01-01), Taylor et al.
patent: 2003/0078703 (2003-04-01), Potts et al.
patent: 2005/0211606 (2005-09-01), Harshbarger et al.
Wynn et al., “Coincidence correction for electrical-zone (Coulter Counter) particle size analysers”, Powder Technology 93, pp. 163-175 (1997).
Wynn, E.J.W., et al., “Coincidence correction for electrical-zone (Coulter-counter) particle size analysers”, Powder Technology 93, pp. 163-175 (1997).
Gonzalez, R.C., et al., “Digital Image Processing”, Addison-Wesley Pub., pp. 580-586 (1993).
Coulter LH 700 Series System reference manual, 114 pages (Oct. 2003).
Coulter®ACT Series Analyzer Reference Manual, Coulter Corporation, 100 pages (1997).
International Search Report and Written Opinion for Int'l Appl. No. PCT/US/ 06/61029, 7 pages, dated Feb. 13, 2008.
Ferman et al, “Robust Color Histogram Descriptors for Video Segment Retrieval and Identification,” IEEE Transactions on Image Processing, vol. 11, No. 5, May 2002, pp. 497-508, (abstract).
Yazici, B. “Statistical Pattern Analysis of Partial Discharge Measurements for Quality Assessment of Insulation Systems in High-Voltage Electrical Machinery,” IEEE Transactions on Industry Applications, vol. 40, No. 6, Dec. 2004, (abstract).
Huo Ziling
Lin Dongqing
Zhang Shuliang
Zheng Min
Barbee Manuel L
Beckman Coulter Inc.
Sterne Kessler Goldstein & Fox P.L.L.C.
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