Systems and methods for non-intrusive testing of signals...

Details Systems and methods for non-intrusive testing of signals... Systems and methods for non-intrusive testing of signals...

2006-04-04

2006-04-04

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S124000, C702S118000, C714S724000

Reexamination Certificate

active

07024328

ABSTRACT:
Structures and methods for non-intrusive testing of communication signals exchanged between two circuit boards via an intermediate interconnect board. In one aspect hereof, the functional signal normally exchanged between the circuits is latched during the exchange of test signals and the latched functional signal is utilized within the circuit that normally receives the functional signal to continue normal operations. In another aspect hereof, the test signals are exchanged over a dedicated test signal path between the two circuits. In another aspect hereof, the test signals are exchanged over the functional signal paths as out of band signals.

REFERENCES:
patent: 2002/0133740 (2002-09-01), Oldfield et al.
patent: 2002/0170006 (2002-11-01), Schaber et al.
patent: 1271334 (2003-01-01), None

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