Systems and methods for non-destructively detecting material...

Details Systems and methods for non-destructively detecting material... Systems and methods for non-destructively detecting material...

2005-02-08

2005-02-08

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Mechanical measurement system

C702S155000, C702S159000, C250S399000, C250S341800

Reexamination Certificate

active

06853926

ABSTRACT:
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface, and a processing unit for producing an image from optical characteristics received from the MIR detection unit. In addition, the system may further comprise a scanning unit for moving the MIR detection unit to a next area.

REFERENCES:
patent: 4076984 (1978-02-01), Gromov et al.
patent: 5850466 (1998-12-01), Schott
patent: 6495833 (2002-12-01), Alfano et al.
patent: 20040026622 (2004-02-01), DiMarzio et al.

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