Optics: measuring and testing – Dimension
Reexamination Certificate
2007-12-04
2007-12-04
Pham, Hoa Q. (Department: 2886)
Optics: measuring and testing
Dimension
C356S338000
Reexamination Certificate
active
09731317
ABSTRACT:
The invention provides systems and methods for measuring the mass of a substance. In one method, energy is applied to a substance and a response resulting from the application of energy as measured. The mass of the substance is then determined based at least in part on the measured response.
REFERENCES:
patent: 3361911 (1968-01-01), Kowalczynski
patent: 3629586 (1971-12-01), Giles
patent: 3744582 (1973-07-01), Withnell et al.
patent: 4147618 (1979-04-01), Richardson et al.
patent: 4223751 (1980-09-01), Ayers et al.
patent: 4461363 (1984-07-01), Loy
patent: 4519506 (1985-05-01), Spaanderman
patent: 4640376 (1987-02-01), Hinzpeter
patent: 4825454 (1989-04-01), Annis et al.
patent: 5053185 (1991-10-01), Christensen et al.
patent: 5617971 (1997-04-01), Eason et al.
patent: 5740794 (1998-04-01), Smith et al.
patent: 5785049 (1998-07-01), Smith et al.
patent: 5826633 (1998-10-01), Parks et al.
patent: 5985248 (1999-11-01), Gordon et al.
patent: 6019968 (2000-02-01), Platz et al.
patent: 6089228 (2000-07-01), Smith et al.
patent: 6182712 (2001-02-01), Stout et al.
patent: 0 531 828 (1992-08-01), None
patent: 0 634 647 (1994-07-01), None
patent: 2 077 422 (1980-06-01), None
patent: WO 95/16483 (1995-06-01), None
patent: WO 95/31238 (1995-11-01), None
patent: WO 96/09085 (1996-03-01), None
patent: WO 97/41031 (1997-11-01), None
patent: WO 99/19215 (1999-04-01), None
patent: WO 99/58180 (1999-11-01), None
patent: WO 01/00262 (2001-01-01), None
“Measurements of lightwave component reflections with the HP 8504B precision reflectometer,” Hewlett Packard, Product Note 8504-1, copyright 1992.
Cheu Scot
Ghandi Jamshed
Nantel Normand
Parks Derrick J.
Smith Adrian
Desai Naishadh
Nektar Therapeutics
Pham Hoa Q.
Tucker Guy V.
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