Systems and methods for monitoring integrated circuit...

Details Systems and methods for monitoring integrated circuit... Systems and methods for monitoring integrated circuit...

2006-03-07

2006-03-07

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07009416

ABSTRACT:
A system for monitoring internal states of an integrated circuit includes logic nodes, selection logic and a monitor unit. The logic nodes are disposed within the integrated circuit and the selection logic is coupled to monitor pins externally accessible on the integrated circuit. The selection logic retrieves internal states of select logic nodes based on signals applied via the monitor pins. The monitor unit reads the internal states of the select logic nodes via the monitor pins.

REFERENCES:
patent: 5418452 (1995-05-01), Pyle
patent: 5479652 (1995-12-01), Dreyer et al.
patent: 5712858 (1998-01-01), Godiwala et al.
patent: 5717695 (1998-02-01), Manela et al.
patent: 5793777 (1998-08-01), Kundu
patent: 6003107 (1999-12-01), Ranson et al.
patent: 6191603 (2001-02-01), Muradali et al.
patent: 6781406 (2004-08-01), Emberling et al.

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