Systems and methods for measuring magnetostriction in...

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material

Reexamination Certificate

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C324S209000

Reexamination Certificate

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10539471

ABSTRACT:
A system for directly measuring a magnetostriction value of a magnetoresistive element includes a fixture for receiving a substrate carrying one or more magnetoresistive elements. A magnet assembly applies a first magnetic field parallel to the substrate, and a magnetic alternating field perpendicular to the substrate and parallel to magnetoresistive layers of the elements. A stress-inducing mechanism applies a mechanical stress to the substrate, the stress being oriented parallel to the substrate. A measuring subsystem measures a signal from at least one of the magnetoresistive elements.

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patent: 5721488 (1998-02-01), Sakai et al.
patent: 6664783 (2003-12-01), Baril et al.
M. Ali, R. Watts, “Measurement of Saturation Magnetostriction Using Novel Strained Substrate Techniques And The Control of the Magnetic Anisotropy,” Journal of Magnetism and Magnetic Materials 202(1999) 85-94.
Lydia Baril, Bruce Gurney, Dennis Wilhoit, and V. Speriosu, “Magnetostriction in Spin Valves,” Journal of Applied Physics, vol. 85, No. 8, Apr. 15, 1999.
IBM Technical Disclosure Bulletin, “Magnetostriction Mapping of Soft Magnetic Films on Thick Rigid Substrates,” vol. 33, No. 8, Jan. 1991.

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