Systems and methods for measuring component matching

Details Systems and methods for measuring component matching Systems and methods for measuring component matching

2006-04-11

2006-04-11

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

C702S168000, C702S127000, C702S155000

Reexamination Certificate

active

07027949

ABSTRACT:
Systems and methods for measuring a contour match between adjacent components are disclosed. In one embodiment, at least two pressure sensors are located between adjacent components. Each pressure sensor is adapted to obtain a pressure measurement at a location a predetermined distance away from the other pressure sensors, and to output a pressure measurement for each sensor location. An output device is adapted to receive the pressure measurements from at least two pressure sensors and display the pressure measurements. In one aspect, the pressure sensors include flexible thin film pressure sensors. In accordance with other aspects of the invention, a method is provided for measuring a contour match between two interfacing components including measuring at least one pressure applied to at least one sensor between the interfacing components.

REFERENCES:
patent: 5375397 (1994-12-01), Ferrand et al.
patent: 6546813 (2003-04-01), Hubbard, Jr.

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