Systems and methods for localizing and analyzing samples on...

Details Systems and methods for localizing and analyzing samples on... Systems and methods for localizing and analyzing samples on...

2011-08-16

2011-08-16

Ludlow, Jan M (Department: 1773)

Chemistry: analytical and immunological testing

Measurement of electrical or magnetic property or thermal...

By means of a solid body in contact with a fluid

C436S166000, C436S174000, C436S526000

Reexamination Certificate

active

07998746

ABSTRACT:
Chips that include one or more particle manipulation mechanisms, or force transduction elements, provided at specific locations to manipulate and localize particles proximal the substrate surface. In one embodiment, individually addressable magnetic control mechanisms such as electric coils are provided at specific locations to create a magnetic field to attract magnetic particles, such a magnetic or magnetizable beads, to those specific locations. In another embodiment, electrostatic control mechanisms such as electrodes are provided to attract and manipulate electrically charged micro-particles. A location may include a crater or well formed in the substrate, or it may include an element on the surface of the substrate. In some embodiments, one or more sensors are located proximal specific locations, e.g., specific craters, so as to analyze specific conditions at each location. In other embodiments, multiple locations share one or more sensors.

REFERENCES:
patent: 4414243 (1983-11-01), Cline
patent: 4822566 (1989-04-01), Newman
patent: 4932255 (1990-06-01), Brace et al.
patent: 5235235 (1993-08-01), Martin et al.
patent: 5655665 (1997-08-01), Allen et al.
patent: 5755942 (1998-05-01), Zanzucchi et al.
patent: 5814525 (1998-09-01), Renschler et al.
patent: 5869748 (1999-02-01), Stevenson et al.
patent: 5874219 (1999-02-01), Rava et al.
patent: 5922617 (1999-07-01), Wang et al.
patent: 5976466 (1999-11-01), Ratner et al.
patent: 6161437 (2000-12-01), Brennan et al.
patent: 6355491 (2002-03-01), Zhou et al.
patent: 6468810 (2002-10-01), Korpela
patent: 6572830 (2003-06-01), Burdon et al.
patent: 6630359 (2003-10-01), Caillat et al.
patent: 2002/0086443 (2002-07-01), Bamdad
patent: 2002/0119470 (2002-08-01), Nerenberg et al.
patent: 2781886 (2000-02-01), None
patent: WO 96/15450 (1996-05-01), None
patent: WO 9615450 (1996-05-01), None
patent: WO 00/43534 (2000-07-01), None
patent: WO 0043534 (2000-07-01), None
patent: WO 00/49382 (2000-08-01), None
patent: WO 00/54882 (2000-09-01), None
patent: WO 0054882 (2000-09-01), None
patent: WO 00/60356 (2000-10-01), None
patent: WO 0060356 (2000-10-01), None
Barnes-Svarney, Patricia, Ed., The New York Public Library Science Desk Reference (MacMillan USA 1995) p. 254.

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