Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2005-11-08
2005-11-08
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
06963816
ABSTRACT:
A multi-channel spectrometer and a light source are used to measure both the emitted and the reflected light from a surface which is at an elevated temperature relative to its environment. In a first method, the temperature of the surface and emissivity in each wavelength is calculated from a knowledge of the spectrum and the measurement of the incident and reflected light. In the second method, the reflected light is measured from a reference surface having a known reflectivity and the same geometry as the surface of interest and the emitted and the reflected light are measured for the surface of interest. These measurements permit the computation of the emissivity in each channel of the spectrometer and the temperature of the surface of interest.
REFERENCES:
patent: 4924478 (1990-05-01), Tank
patent: 5231595 (1993-07-01), Makino et al.
patent: 5255286 (1993-10-01), Moslehi et al.
patent: 6299346 (2001-10-01), Ish-Shalom et al.
patent: 6479801 (2002-11-01), Shigeoka et al.
patent: 6682216 (2004-01-01), Small IV et al.
patent: 6733173 (2004-05-01), Huston et al.
patent: 2002/0192847 (2002-12-01), Ino et al.
patent: 2003/0067956 (2003-04-01), Hashimoto et al.
Daubenspeck William C.
Gottlieb Paul A.
Kehl Dickson
Pretlow Demetrius
The United States of America as represented by the United States
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