Systems and methods for inspecting an optical interface

Optics: measuring and testing – Inspection of flaws or impurities

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S073100

Reexamination Certificate

active

07042562

ABSTRACT:
A system enables inspection of an optical connector. The system includes a positioning subassembly, an electronic sensor (e.g., a scanner, a camera, etc.), and a controller coupled to the positioning subassembly and the electronic sensor. The controller is configured to position the electronic sensor over the optical connector, activate the electronic sensor to obtain a set of electronic signals which defines a set of current images of the optical connector, and electronically generate a result based on the set of electronic signals. The result indicates an attribute of the optical connector. Accordingly, the system is capable of inspecting the optical connector in a repeatable and non-subjective manner.

REFERENCES:
patent: 3209301 (1965-09-01), Duffy, Jr.
patent: 4088386 (1978-05-01), Hawk
patent: 4158476 (1979-06-01), McCartney
patent: 4258977 (1981-03-01), Lukas et al.
patent: 4277135 (1981-07-01), Schrott et al.
patent: 4436366 (1984-03-01), Abramson
patent: 4456351 (1984-06-01), Hiramatsu et al.
patent: 4469398 (1984-09-01), De Baets et al.
patent: 4613105 (1986-09-01), Genequand et al.
patent: 4787706 (1988-11-01), Cannon et al.
patent: 4904036 (1990-02-01), Blonder
patent: 5073000 (1991-12-01), Derfiny
patent: 5082344 (1992-01-01), Mulholland et al.
patent: 5121454 (1992-06-01), Iwano et al.
patent: 5123073 (1992-06-01), Pimpinella
patent: 5144611 (1992-09-01), Engler et al.
patent: 5177557 (1993-01-01), Yamane
patent: 5179419 (1993-01-01), Palmquist et al.
patent: 5204925 (1993-04-01), Bonanni et al.
patent: 5220407 (1993-06-01), Yamane et al.
patent: 5220703 (1993-06-01), Kanayama et al.
patent: 5257332 (1993-10-01), Pimpinella
patent: 5283851 (1994-02-01), Vergnolle
patent: 5337396 (1994-08-01), Chen et al.
patent: 5347698 (1994-09-01), Kinoshita et al.
patent: 5348487 (1994-09-01), Marazzi et al.
patent: 5379362 (1995-01-01), Kawamura
patent: 5394503 (1995-02-01), Dietz, Jr. et al.
patent: 5425831 (1995-06-01), Grimes et al.
patent: 5459564 (1995-10-01), Chivers
patent: 5513293 (1996-04-01), Holland et al.
patent: 5598494 (1997-01-01), Behrmann et al.
patent: 5598495 (1997-01-01), Rittle et al.
patent: 5640246 (1997-06-01), Castonguay
patent: 5724127 (1998-03-01), Csipkes et al.
patent: 5725154 (1998-03-01), Jackson
patent: 5768738 (1998-06-01), Lee
patent: 5770001 (1998-06-01), Nagayama et al.
patent: 5778123 (1998-07-01), Hagan et al.
patent: 5838856 (1998-11-01), Lee
patent: 5845028 (1998-12-01), Smith et al.
patent: 5845036 (1998-12-01), DeMarchi
patent: 5920670 (1999-07-01), Lee et al.
patent: 5940560 (1999-08-01), DeMarchi et al.
patent: 6005991 (1999-12-01), Knasel
patent: 6041652 (2000-03-01), Stewart
patent: 6205700 (2001-03-01), Rigby et al.
patent: 6233376 (2001-05-01), Updegrove
patent: 6259840 (2001-07-01), Munoz-Bustamante et al.
patent: 6270262 (2001-08-01), Hudgins et al.
patent: 6296398 (2001-10-01), Lu
patent: 6300082 (2001-10-01), Erb et al.
patent: 6304690 (2001-10-01), Day
patent: 6305848 (2001-10-01), Gregory
patent: 6361218 (2002-03-01), Matasek et al.
patent: 6419399 (2002-07-01), Loder et al.
patent: 6518997 (2003-02-01), Chow et al.
patent: 196 53 754 (1998-07-01), None
patent: 0 813 083 (1997-12-01), None
patent: 1 048 963 (2000-11-01), None
patent: 63-285961 (1988-10-01), None
patent: 05040074 (1993-02-01), None
patent: 05118830 (1993-05-01), None
patent: 10-74884 (1998-03-01), None
patent: WO 98/14810 (1998-04-01), None
patent: WO 99/13367 (1999-03-01), None
patent: WO 03/102656 (2003-12-01), None
3M Utilities and Telecommunications: VOL-0570 VF-45™ Maintenance Cleaning Kit; http://products.3m.com/us/util—telecom/products/tsdvolition.jhtml?powurl=GSN8925771gs; Visited Site on Apr. 24, 2002; 2 Pages.
http://multimedia.mmm.com/mws/mediawebserver.dyn?666666Ozjcf6Ivs6Evs666tQ3c7rr; Visited Site on Apr. 24, 2002; 1 Page of Picture.
European Patent Office; Patent Abstracts of Japan; Publication No.: 2002031739; Publication Date: Jan. 31, 2002; Application No.: 2000215365; Applicant: NTT Advanced Technology Corp.; 1 Page.
WO 98 35821 A (Soes Lucas; Blieck Roland Trsitan De (NL); Broeksteeg Johannes Mar) Aug. 20, 1998.
New York Institute of Photography; Tips for Better Photographs; http://www.nyip.com/sub—idx—pgs/referidx.camera—corner—0599.html; 4 pages.
WO 03 021320 (Teradyne Inc.) Mar. 13, 2003.
Molex, HBMT ™ MT High Density Backplane Interconnect System, Mounting Style: Rivet or Screw, Housing: UL V-O.
Partial International Search Report from PCT/US03/40293, 2 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Systems and methods for inspecting an optical interface does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Systems and methods for inspecting an optical interface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems and methods for inspecting an optical interface will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3568773

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.