Systems and methods for in situ spectroscopic measurements

Details Systems and methods for in situ spectroscopic measurements Systems and methods for in situ spectroscopic measurements

2008-01-15

2008-01-15

Lauchman, Layla G. (Department: 2877)

Optics: measuring and testing

For light transmission or absorption

Of fluent material

C356S432000

Reexamination Certificate

active

07319522

ABSTRACT:
A circularizated semiconductor laser diode (CSLD), such as for example a vertical cavity surface emitting laser (VCSEL) may be used for optical measurements. The CSLD may be used in a cell density probe to perform cell density determination and/or turbidity determination, such as in a biotech, fermentation, or other optical absorbance application. The cell density probe may comprise a probe tip section made from a polytetrafluoroethylene material, which provides sealability, ease of manufacture, durability, cleanability, optical semi-transparency at visible and near infrared wavelengths, and other advantages. The probe tip advantageously provides an optical gap that allows for in situ measurements of optical measurements including but not limited to absorbance, scattering, and fluorescence.

REFERENCES:
patent: 3609047 (1971-09-01), Marlow
patent: 4200896 (1980-04-01), Baumann
patent: 4666672 (1987-05-01), Miller et al.
patent: 4954318 (1990-09-01), Yafuso et al.
patent: 5005005 (1991-04-01), Brossia et al.
patent: 5313940 (1994-05-01), Fuse et al.
patent: 5316950 (1994-05-01), Apitz et al.
patent: 5402777 (1995-04-01), Warring et al.
patent: 5625617 (1997-04-01), Hopkins et al.
patent: 5742581 (1998-04-01), Ja
patent: 5798940 (1998-08-01), Bratton et al.
patent: 6115061 (2000-09-01), Lieberman et al.
patent: 6147754 (2000-11-01), Theriault et al.
patent: 6253097 (2001-06-01), Aronow et al.
patent: 6265945 (2001-07-01), Delaney et al.
patent: 6320472 (2001-11-01), Vanier
patent: 6567166 (2003-05-01), Ottens et al.
patent: 6615064 (2003-09-01), Aldrich
patent: 6771374 (2004-08-01), Rangarajan et al.
patent: 6819950 (2004-11-01), Mills
patent: 6950260 (2005-09-01), Coffey et al.
patent: 7061593 (2006-06-01), Braig et al.
patent: 7161582 (2007-01-01), Bathiche et al.
patent: 2001/0020123 (2001-09-01), Diab et al.
patent: 2002/0101566 (2002-08-01), Elsner et al.
patent: 2003/0053244 (2003-03-01), Lewis

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