Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate
2007-10-02
2007-10-02
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
Position or displacement
Position transverse to viewing axis
C356S614000, C356S623000, C356S624000
Reexamination Certificate
active
11138175
ABSTRACT:
Systems and methods are disclosed for focusing a beam for an interaction with a film deposited on a substrate wherein the focused beam defines a short axis and a long axis. In one aspect, the system may include a detecting system to analyze light reflected from the film on an image plane to determine whether the beam is focused in the short axis at the film. In still another aspect, a system may be provided for positioning a film (having an imperfect, non-planar surface) for interaction with a shaped line beam.
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Boucky Otto
Brenner Kurt
Das Palash P.
Grupp Guenter
Hoell Michael
Carl Zeiss Industrielle Messtechnik GmbH
Chowdhury Tarifur
Cymer Inc.
Hillman Matthew
Pajoohi Tara S
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