Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2006-09-12
2006-09-12
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
C385S012000
Reexamination Certificate
active
07106449
ABSTRACT:
An optical fiber device with reduced thermal sensitivity comprises a first optical fiber arm having a first composite coefficient of thermal expansion and a first length and a second optical fiber arm having a second composite coefficient of thermal expansion and a second length. A ratio of the first and second lengths inversely matches a ratio of the first and second composite coefficients of thermal expansion to minimize thermal sensitivity in the device.
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Gurunathan Mohan
Pering Richard D.
Szafraniec Bogdan
Agilent Technologie,s Inc.
Lee Hwa (Andrew)
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