Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-06-14
2005-06-14
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C716S030000
Reexamination Certificate
active
06907376
ABSTRACT:
A preferred integrated circuit for facilitating receiver trip level testing functionality includes a first pad which incorporates a first driver and a first receiver. The first driver is configured to provide a first pad output signal to a component external to the IC. The first receiver is configured to receive a first pad input signal from a component external to the IC, and to provide a first receiver digital output signal to a component internal to the IC in response to the first pad input signal. Additionally, a first test circuit is provided that is arranged internal to the IC, with the first test circuit being adapted to provide information corresponding to at least one receiver trip-level characteristic of the first receiver of the first pad. Systems, methods and computer readable media also are provided.
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Rearick Jeffrey R.
Rohrbaugh John G.
Shepston Shad R.
Agilent Technologie,s Inc.
Raymond Edward
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