Systems and methods for edge measurement

Details Systems and methods for edge measurement Systems and methods for edge measurement

2007-02-02

2010-06-01

Izaguirre, Ismael (Department: 3765)

Sewing

Method of sewing

Material sensing

C112S153000, C112S306000, C700S136000, C271S227000

Reexamination Certificate

active

07726252

ABSTRACT:
A method for straightening the edges of a work piece. The method includes the steps of determining the average edge position of each edge of the work piece, calculating an average edge line for each edge of the work piece, determining an actual corner point for each corner of the work piece, calculating a determined edge line through each of the actual corner points of the work piece, determining a number of actual edge points, determining if actual edge points are within the determined edge lines, and adjusting the determined edge lines inward until the actual edge points are within the determined edge lines.

REFERENCES:
patent: 5035415 (1991-07-01), Lee et al.
patent: 5416992 (1995-05-01), Ueda et al.
patent: 5437238 (1995-08-01), Price et al.
patent: 5619942 (1997-04-01), Stewart et al.
patent: 5685248 (1997-11-01), Stewart et al.
patent: 5928462 (1999-07-01), Stewart et al.
patent: 5941187 (1999-08-01), Rouleau et al.
patent: 6136120 (2000-10-01), Stewart et al.
patent: 6260495 (2001-07-01), Stewart et al.
patent: 6533267 (2003-03-01), Muessig et al.
patent: 2003/0042670 (2003-03-01), Sahlmann
patent: 2005/0028410 (2005-02-01), McCabe
patent: 2006/0038340 (2006-02-01), Schinzel-Reiner et al.
patent: 2008/0237975 (2008-10-01), de Jong et al.

Affiliated with

Also associated with

Rating

Systems and methods for edge measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Systems and methods for edge measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems and methods for edge measurement will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4191585