Measuring and testing – Vibration – By mechanical waves
Reexamination Certificate
2007-07-03
2007-07-03
Williams, Hezron (Department: 2856)
Measuring and testing
Vibration
By mechanical waves
C073S602000, C073S628000
Reexamination Certificate
active
11081922
ABSTRACT:
Systems and methods for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials are described herein. In embodiments, a surface skimming longitudinal wave is generated at a first location on a material, at least a portion of that wave is detected at a second location on the material, the time-of-flight of that wave between the first and second locations is determined, and then the velocity of that wave is determined. One or more crystallographic orientations of the material may then be determined based upon that velocity.
REFERENCES:
patent: 4406167 (1983-09-01), Maeda
patent: 4412345 (1983-10-01), Workman et al.
patent: 4747684 (1988-05-01), Weiser
patent: 4788702 (1988-11-01), Howe et al.
patent: 4862488 (1989-08-01), Schiller
patent: 4890496 (1990-01-01), Birring et al.
patent: 5251486 (1993-10-01), Thompson et al.
patent: 5459001 (1995-10-01), Estes et al.
patent: 5631424 (1997-05-01), Nieters et al.
patent: 5760522 (1998-06-01), Kobayashi et al.
patent: 5768335 (1998-06-01), Shahid
patent: 5922961 (1999-07-01), Hsu et al.
patent: 6037699 (2000-03-01), Kobayashi et al.
patent: 6112595 (2000-09-01), Stanke et al.
patent: 6198796 (2001-03-01), Yokoyama et al.
patent: 6332361 (2001-12-01), Yamada et al.
patent: 6424922 (2002-07-01), Bray
patent: 6439054 (2002-08-01), Gore et al.
patent: 6450036 (2002-09-01), Ashida et al.
patent: 6462340 (2002-10-01), Inokuti
patent: 6477473 (2002-11-01), Bray
patent: 6523418 (2003-02-01), Bray
patent: 2002/0078759 (2002-06-01), Bray
Bescond, C. et al.,Laser-Generated Surface Skimming Longitudinal Wave Measurement of Residual Stress in Shot Peened Samples, American Institute of Physics Conference Proceedings, vol. 820, Mar. 6, 2006, pp. 1426-1433.
Kielczynski, P. J. et al.,Characterization of Texture in Hexagonal Materials Using a Line of Focus Acoustic Microscope, IEEE Ultrasonics Symposium Proceedings, Dec. 8, 1991, pp. 1009-1013.
Satish, Shamachary et al. Development of a Scan System for Rayleigh, Shear and Longitudinal Wave Velocity Mapping, IEEE Ultrasonics Symposium Proceedings, vol. 1, Oct. 17, 1999, pp. 597-600.
European Search Report dated Aug. 11, 2006.
Smith Kevin D.
Thompson R. Bruce
Umbach Jeffrey A.
Loughlin Tracey R.
Saint-Surin Jacques M.
United Technologies Corporation
Williams Hezron
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