Systems and methods for detecting device-under-test dependency

Details Systems and methods for detecting device-under-test dependency Systems and methods for detecting device-under-test dependency

2007-03-27

2007-03-27

Nguyen, Dung Van (Department: 3723)

Abrading

Precision device or process - or with condition responsive...

Computer controlled

C451S008000

Reexamination Certificate

active

11245532

ABSTRACT:
A system of process control is provided. The system comprises a first processing tool, a first sensor, a second processing tool, and a processor. The first processing tool processes a first workpiece. The first sensor provides real-time monitoring (RTM) data of the first processing tool while processing the first workpiece. The second processing tool processes the first workpiece subsequent to the first processing tool. The processor adjusts, according to the real-time monitoring data and a preset program, the first processing tool for processing a second workpiece, and the second processing tool for processing the first workpiece.

REFERENCES:
patent: 6640151 (2003-10-01), Somekh et al.
patent: 6698009 (2004-02-01), Pasadyn et al.
patent: 6751518 (2004-06-01), Sonderman et al.
patent: 2002/0192966 (2002-12-01), Shanmugasundram et al.
patent: 2005/0032459 (2005-02-01), Surana et al.

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