Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-12-12
2006-12-12
Bali, Vikkram (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S151000, C356S237500
Reexamination Certificate
active
07149344
ABSTRACT:
A method of analyzing an image of a substance deposited onto a substrate, the image comprising a plurality of pixels, includes defining a region of interest in the image, associating the region of interest with first and second perpendicular axis, wherein a set of pixels in the image lie along the first axis, converting the pixels in the region of interest to a single dimensional array aligned with the first axis and projecting along the second axis, and applying at least one threshold to the single dimensional array, the threshold based at least in part on a predetermined limit.
REFERENCES:
patent: 5060063 (1991-10-01), Freeman
patent: 5172420 (1992-12-01), Ray et al.
patent: RE34615 (1994-05-01), Freeman
patent: 5455870 (1995-10-01), Sepai et al.
patent: 5801965 (1998-09-01), Takagi et al.
patent: 5807606 (1998-09-01), Mould et al.
patent: 5873939 (1999-02-01), Doyle et al.
patent: 6066206 (2000-05-01), Doyle et al.
patent: 6324973 (2001-12-01), Rossmeisl et al.
patent: 6362877 (2002-03-01), Kobayashi et al.
patent: 6366690 (2002-04-01), Smilansky et al.
patent: 6549648 (2003-04-01), Rinn
patent: 6738505 (2004-05-01), Prince
patent: 6891967 (2005-05-01), Prince
patent: 2002/0019729 (2002-02-01), Change et al.
patent: 2004/0218808 (2004-11-01), Prince
patent: 2 286 670 (1995-08-01), None
patent: WO 95/16247 (1995-06-01), None
patent: WO 98/37741 (1998-08-01), None
patent: WO 00/67005 (2000-11-01), None
* International Search Report for PCT/US04/41462 mailed Oct. 4, 2005.
International Search Report for PCT/US2005/004823 mailed May 20, 2005.
*Ritter et al., “Handbook of Computer Vision Algorithms in Image Algebra,” CRC Press, Inc., Boca Raton, FL (1996), Ch. 2,3 and 4 (pp. 51-141).
*Russ, John C., “The Image Processing Handbook,” 2ndEdition, CRC Press, Inc., Boca Raton, FL (1995), pp. 155-160, 211-237, 259-262, 361-371, 481-500.
*Cognex Press Release, “Cognex Introduces New Machine Vision System for Detecting Screen Printing Defects on Printed Circuit Boards,” (2 pgs.); http://www.cognex.com/press/release/products/pasteinspect.htm.
*International Search Report for PCT/US00/12121 mailed Sep. 1, 2000.
Bali Vikkram
Lowrie Lando & Anastasi, LLP
Speedline Technologies, Inc.
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