Systems and methods for detecting capacitor process variation

Details Systems and methods for detecting capacitor process variation Systems and methods for detecting capacitor process variation

2006-08-31

2009-11-17

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S672000, C324S684000, C327S553000

Reexamination Certificate

active

07619421

ABSTRACT:
A method for detecting capacitor variation in a device comprises operating an oscillator in the device, the oscillator being an Inductive-Capacitive (LC) oscillator and including an inductor of known value and a capacitor under test, comparing an output of the oscillator to a reference output, and evaluating variation for a plurality of capacitors in the device based on the comparing.

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