Systems and methods for defect testing of externally...

Details Systems and methods for defect testing of externally... Systems and methods for defect testing of externally...

2007-01-25

2009-11-03

Karlsen, Ernest F (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S538000, C714S733000

Reexamination Certificate

active

07612574

ABSTRACT:
Apparatus and methods provide built-in testing enhancements in integrated circuits. These testing enhancements permit, for example, continuity testing to pads and/or leakage current testing for more than one pad. The disclosed techniques may permit more thorough testing of integrated circuits at the die level, thereby reducing the number of defective devices that are further processed, saving both time and money. In one embodiment, a test signal is routed in real time through a built-in path that includes an input buffer for a pad under test. This permits testing of continuity between the pad and the input buffer. An output buffer can also be tested as applicable. In another embodiment, two or more pads of a die are electronically coupled together such that leakage current testing applied by a probe connected to one pad can be used to test another pad.

REFERENCES:
patent: 5457381 (1995-10-01), Farwell
patent: 5523697 (1996-06-01), Farnworth et al.
patent: 5592736 (1997-01-01), Akram et al.
patent: 6124721 (2000-09-01), Farnworth et al.
patent: 6199182 (2001-03-01), Whetsel
patent: 6380555 (2002-04-01), Hembree et al.
patent: 6392426 (2002-05-01), Farnworth et al.
patent: 6414506 (2002-07-01), Akram et al.
patent: 6614249 (2003-09-01), Farnworth et al.
patent: 6657450 (2003-12-01), Farnworth et al.
patent: 6701470 (2004-03-01), Mullarkey et al.
patent: 6995581 (2006-02-01), Barr et al.

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