Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2008-05-29
2009-11-03
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
Lamp beam direction or pattern
C356S122000
Reexamination Certificate
active
07612876
ABSTRACT:
A measure of the quality of a laser beam is obtained by comparing the power of a theoretical Gaussian beam through a (certain sized area) pinhole to the power of a test beam through a same sized (area) pinhole. The theoretical surrogate Gaussian beam with the same second moment of intensity as the test beam is used to determine the “bucket size” used in “power-in-the-bucket” techniques. The bucket size is an interaction area determined by the wavelength of the laser light, the focusing distance, and the 1/e2radius of the near field intensity. The beam quality is determined by taking the square root of the ratio of the theoretical power through a bucket and the actual power through a pinhole with the same size as the bucket. The beam quality of different types of beam profiles can be obtained with a single method or measure.
REFERENCES:
patent: 4783055 (1988-11-01), Widen et al.
patent: 4910690 (1990-03-01), Fijita
patent: 5078491 (1992-01-01), Johnson, Jr.
patent: 5100231 (1992-03-01), Sasnett et al.
patent: 5124993 (1992-06-01), Braunlich et al.
patent: 5315614 (1994-05-01), Grace et al.
patent: 5329350 (1994-07-01), Wright et al.
patent: 5387106 (1995-02-01), Mackenzie et al.
patent: 5418882 (1995-05-01), Ortiz, Jr.
patent: 5459565 (1995-10-01), Aharon
patent: 6044329 (2000-03-01), Kidd
patent: 6052180 (2000-04-01), Neal et al.
patent: 6549092 (2003-04-01), Hattori et al.
patent: 6606158 (2003-08-01), Rosenfeldt et al.
patent: 7128737 (2006-10-01), Goder et al.
patent: 7193693 (2007-03-01), Yazaki et al.
U.S. Appl. No. 10/701,760, filed Nov. 4, 2003.
Haynes and Boone, LLP.
Nguyen Sang
The Boeing Company
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