Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate
2005-11-08
2005-11-08
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By particle light scattering
With photocell detection
C356S364000, C356S438000
Reexamination Certificate
active
06963400
ABSTRACT:
Methods for analyzing particle systems using polarized scattered light are provided. An exemplary method comprises the steps of: providing models of multiple arbitrary particle systems; performing ray-trace analysis with respect to the models over a range of scatter angles, the ray-trace analysis involving only use of second-order rays; receiving information corresponding to a particle system of interest; and predicting at least one characteristic of the particle system of interest using information generated during the ray-trace analysis. Systems and other methods are provided.
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Punnoose Roy M.
Randolph William
The United States of America as represented by the Secretary of
Toatley , Jr. Gregory J.
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