Systems and methods for analyzing data of an SPI data bus

Details Systems and methods for analyzing data of an SPI data bus Systems and methods for analyzing data of an SPI data bus

2005-05-17

2005-05-17

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C710S100000

Reexamination Certificate

active

06895365

ABSTRACT:
Systems and methods for analyzing data transferred through an SPI data bus are presented. In one exemplary preferred embodiment of the invention, an SPI data probe imitates an SPI device coupled to the SPI data bus and receives data from the SPI data bus so that the data may be analyzed. The SPI data probe transfers the data to an analysis unit without substantially altering impedance more than the SPI device would. The SPI data probe includes connectors configured for coupling the probe to the SPI data bus and for coupling the probe to an analysis unit. The SPI data probe also includes circuitry that may buffer, compensate and deskew the data as an SPI device would.

REFERENCES:
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patent: 6111717 (2000-08-01), Cloke et al.
patent: 6510532 (2003-01-01), Pelly et al.
patent: 6623062 (2003-09-01), Hoffman
patent: 6629062 (2003-09-01), Coffey et al.

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