Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-06-24
2010-11-30
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S457000, C343S703000
Reexamination Certificate
active
07844407
ABSTRACT:
Methods and apparatus for analysis and design of radiation and scattering objects are disclosed. In one embodiment, unknown sources are spatially grouped to produce a system interaction matrix with block factors of low rank within a given error tolerance and the unknown sources are determined from compressed forms of the factors.
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Cosimano Edward R
Stellitano Patrick
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