Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate
2005-08-30
2005-08-30
Lauchman, Layla (Department: 2877)
Optics: measuring and testing
Position or displacement
Position transverse to viewing axis
C356S614000, C250S231130, C382S278000
Reexamination Certificate
active
06937349
ABSTRACT:
An absolute 2D position-sensing device is usable to measure the position of a first element with respect to a second element. A 2D absolute scale includes an integrated 2D absolute scale pattern extending over the 2D scale area along each measuring axis of the scale. The integrated 2D absolute scale pattern includes a predetermined quasi-random pattern repeatedly interleaved with a plurality of code portions along each axis. Each code portion includes a plurality of code elements indicative of an absolute measurement value. The offset of the quasi-random pattern relative to a readhead of the device is combined with the absolute measurement value to determine an absolute position to a very high resolution over a relatively large 2D range.
REFERENCES:
patent: 4967093 (1990-10-01), Takemori
patent: 5104225 (1992-04-01), Masreliez
patent: 5198869 (1993-03-01), Monteverde et al.
patent: 6642506 (2003-11-01), Nahum et al.
patent: 6677948 (2004-01-01), Wasserman et al.
patent: 6781694 (2004-08-01), Nahum et al.
patent: 6873422 (2005-03-01), Nahum et al.
patent: 1 099 936 (2001-05-01), None
patent: 1 382 940 (2004-01-01), None
Jones Benjamin K.
Nahum Michael
Lauchman Layla
Mitutoyo Corporation
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