Systems and methods for a multiple angle light scattering...

Optics: measuring and testing – By particle light scattering – With photocell detection

Reexamination Certificate

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C356S336000

Reexamination Certificate

active

07616311

ABSTRACT:
A particle detection system uses a reflective optic comprising a curved surface to detect high angle scattered light generated by a particle in a liquid medium, when a laser beam is incident on the particle. When the particles transit the laser beam, light is scattered in all directions and is described by MIE scattering theory for particles about the size of the wavelength of light and larger or Rayleigh Scattering when the particles are smaller than the wavelength of light. By using the reflective optic, the scattered light can be detected over angles that are greater than normally obtainable.

REFERENCES:
patent: 4273443 (1981-06-01), Hogg
patent: 4548473 (1985-10-01), Lo et al.
patent: 4548500 (1985-10-01), Wyatt et al.
patent: 4710025 (1987-12-01), Wyatt et al.
patent: 4716123 (1987-12-01), Wood
patent: 4877747 (1989-10-01), Stewart
patent: 5125737 (1992-06-01), Rodriguez et al.
patent: 5633503 (1997-05-01), Kosaka
patent: 5644388 (1997-07-01), Maekawa et al.
patent: 5721433 (1998-02-01), Kosaka
patent: 5760900 (1998-06-01), Ito et al.
patent: 5786894 (1998-07-01), Shields et al.
patent: 5962853 (1999-10-01), Huth-Fehre et al.
patent: 6016712 (2000-01-01), Warden et al.
patent: 6177994 (2001-01-01), Watson et al.
patent: 6263227 (2001-07-01), Boggett et al.
patent: 6347374 (2002-02-01), Drake et al.
patent: 6421121 (2002-07-01), Haavig et al.
patent: 6515737 (2003-02-01), Perry
patent: 6519033 (2003-02-01), Quist et al.
patent: 6541627 (2003-04-01), Ono et al.
patent: 6573992 (2003-06-01), Drake
patent: 6590652 (2003-07-01), Quist et al.
patent: 6628386 (2003-09-01), Davis et al.
patent: 6630990 (2003-10-01), van't Oever et al.
patent: 6639672 (2003-10-01), Haavig et al.
patent: 6713019 (2004-03-01), Ozasa et al.
patent: 6760107 (2004-07-01), Drake
patent: 6774995 (2004-08-01), Quist et al.
patent: 6859277 (2005-02-01), Wagner et al.
patent: 6934022 (2005-08-01), Engelhardt
patent: 6972424 (2005-12-01), Quist et al.
patent: 7057724 (2006-06-01), Mead et al.
patent: 7072038 (2006-07-01), Quist et al.
patent: 2002/0093641 (2002-07-01), Ortyn et al.
patent: 2002/0141902 (2002-10-01), Ozasa et al.
patent: 2002/0186372 (2002-12-01), Haavig et al.
patent: 2003/0035105 (2003-02-01), Quist et al.
patent: 2003/0086087 (2003-05-01), Quist et al.
patent: 2003/0086608 (2003-05-01), Frost et al.
patent: 2003/0090657 (2003-05-01), Drake
patent: 2003/0107734 (2003-06-01), Davis et al.
patent: 2003/0227545 (2003-12-01), Soya et al.
patent: 2004/0004716 (2004-01-01), Mavliev
patent: 2004/0201845 (2004-10-01), Quist et al.
patent: 2005/0151968 (2005-07-01), Drake et al.
patent: 2005/0243322 (2005-11-01), Lasker et al.
patent: 2006/0261941 (2006-11-01), Drake et al.
patent: 2007/0013910 (2007-01-01), Jiang et al.
PCT/US06/23043, International Search Report and Written Opinion of the International Searching Authority mailed Sep. 12, 2007.

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