Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-06-29
2009-02-17
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S705000
Reexamination Certificate
active
07492171
ABSTRACT:
One arrangement includes a sense element to convey a current from a source to a load and a compensation element located proximate to the sense element. The compensation element having a resistance that changes proportional to a change in temperature of the sense element. The arrangement further includes an operational amplifier having a first input connected to the sense element, a second input connected to the compensation element and an output that provides an output signal that biases a current through the compensation element in response to a voltage across the sense element. The bias current provides an output signal proportional to the conveyed current and the compensation element provides temperature compensation for the output signal. Other embodiments are also disclosed.
REFERENCES:
patent: 5663667 (1997-09-01), Blum et al.
patent: 6046556 (2000-04-01), Cargille
patent: 2007/0274015 (2007-11-01), Isham
Intel Corporation
Nguyen Vincent Q
Schubert Osterrieder & Nickelson PLLC
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