System with functional and selector circuits connected by...

Details System with functional and selector circuits connected by... System with functional and selector circuits connected by...

2006-01-17

2006-01-17

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

06987382

ABSTRACT:
A wafer of semiconductor material is processed to form integrated circuit dies. The dies are to be singulated or separated and encapsulated for sale and use as integrated circuits. Before singulation, the dies are tested while still a part of the wafer. Die selector circuits are also formed in the wafer between the dies. The die selector circuits are used to select desired ones of the dies for testing. The die selector circuits have two or four clock signals interconnected with adjacent die selector circuits. The sequence of clock signals specifies the die or dies to be selected for testing. The interconnection of two or four clock signals facilitates testing even if the interconnection of one of more clock signals between die selector circuits is broken or opened.

REFERENCES:
patent: 5107208 (1992-04-01), Lee
patent: 5235273 (1993-08-01), Akar et al.
patent: 5347523 (1994-09-01), Khatri et al.
patent: 5442282 (1995-08-01), Rostoker et al.
patent: 5744949 (1998-04-01), Whetsel
patent: 5815511 (1998-09-01), Yamamoto
patent: 5847561 (1998-12-01), Whetsel
patent: 5870342 (1999-02-01), Fukuda
patent: 6243842 (2001-06-01), Slezak et al.
patent: 6333879 (2001-12-01), Kato et al.

Affiliated with

Also associated with

Rating

System with functional and selector circuits connected by... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System with functional and selector circuits connected by..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System with functional and selector circuits connected by... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3553281