System to calibrate on-die temperature sensor

Details System to calibrate on-die temperature sensor System to calibrate on-die temperature sensor

2006-06-28

2008-08-26

Karlsen, Ernest F. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07417448

ABSTRACT:
A system may include biasing of diodes of a temperature sensor disposed in an integrated circuit die using a current from an off-die current source, generation of a voltage based on the current and a temperature of the integrated circuit die, and determination of a first temperature based on the voltage. Such a system may further include amplification of the voltage using an oscillator and a chopper stabilizer, determination of a first amplified voltage associated with a first state of the oscillator and a second amplified voltage associated with a second state of the oscillator, and determination of a third voltage based on the first amplified voltage and the second amplified voltage, wherein determination of the first temperature based on the voltage comprises determination of the first temperature based on the third voltage.

REFERENCES:
patent: 6724196 (2004-04-01), Chiaro et al.
patent: 7332358 (2008-02-01), Orr

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