System testing device and method using JTAG circuit for testing

Details System testing device and method using JTAG circuit for testing System testing device and method using JTAG circuit for testing

1997-07-30

1998-07-14

Beausoliel, Jr., Robert W.

Excavating

G01R 3128

Patent

active

057815607

ABSTRACT:
A method and system testing device for testing a printed circuit board includes a JTAG circuit provided with a JTAG instruction storage unit for storing a command to control a system logic circuit; and a JTAG data storage unit for storing data used to control the system logic circuit. The system testing device tests the system logic circuit in an LSI by selectively inputting/outputting data to a boundary scan register, a bypass register, the JTAG instruction storage unit, and the JTAG data storage unit.

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IEEE STD 1149. Jan. 1990, "IEEE Standard Test Access Port and Boundary-Scan Architecture", pp. 1-1, 1990.

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