Image analysis – Applications – Manufacturing or product inspection
Patent
1996-09-24
1999-10-19
Tran, Phuoc
Image analysis
Applications
Manufacturing or product inspection
382224, G06K 900
Patent
active
059701668
ABSTRACT:
A method and system detect for the presence of an object of unknown shape, configuration, orientation and location within a non-rigid semi-opaque enclosure. The semi-opaque enclosure has a pattern which is visible on at least a first of its external surfaces. The semi-opaque enclosure may comprise, for example, a photo-envelope containing a film package, and the visible pattern may be print and graphical information provided on the envelope's outer surface. A first digital image (containing just the front print) is captured from first channel light reflected off the first external surface of the enclosure; and a second digital image (containing the front print and a silhouette of the object) is captured from second channel light navigating the object inside the enclosure and emanating from the first external surface of the enclosure. A difference image is formed substantially devoid of information representing the visible pattern on the first external surface, by subtracting one of the first and second digital images from the other. Additional segmentation processing may be performed on the difference image in order to better identify the presence of a defect or non-conforming object within the semi-opaque enclosure.
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Cognex Corporation
Miele Anthony L.
Tran Phuoc
Weinzimmer Russ
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