Image analysis – Applications – Manufacturing or product inspection
Patent
1999-04-07
2000-10-17
Couso, Jose L.
Image analysis
Applications
Manufacturing or product inspection
382142, 382143, 382199, G06K 900, G06K 948
Patent
active
061343439
ABSTRACT:
A method and system detect for the presence of a defect or a non-conforming object of unknown shape, configuration, and location within a semi-opaque enclosure. The semi-opaque enclosure has a pattern which is visible on at least a first of its external surfaces. The semi-opaque enclosure may comprise, for example, a labeled plastic or glass bottle, and the visible pattern may be print and graphical information provided on the bottle's label. A first digital image is captured from first channel light reflected off the first external surface of the enclosure; and a second digital image is captured from second channel light navigating the object inside the enclosure and emanating from the first external surface of the enclosure. A difference image is formed substantially devoid of information representing the visible pattern on the first external surface, by subtracting one of the first and second digital images from the other. Additional segmentation processing may be performed on the difference image in order to better identify the presence of a defect or non-conforming object within the semi-opaque enclosure.
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Cognex Corporation
Couso Jose L.
Dang Duy M.
Miele Anthony L.
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