Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2006-10-17
2006-10-17
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
Reexamination Certificate
active
07124061
ABSTRACT:
A system LSI is provided which has a function of enabling data of an external device to be correctly read, when high-speed testing is carried out at a clock signal which is higher-speed than that at a time of usual operation. The system LSI has an external terminal for input of a wait signal from a testing device which is connected when high-speed testing is carried out. Moreover, when the wait signal is supplied to an external bus controller, the external bus controller extends an access time to a ROM during a period of time over which the wait signal is supplied.
REFERENCES:
patent: 5740382 (1998-04-01), Woodbridge et al.
patent: 6629258 (2003-09-01), Kotaka
patent: 2002/0019898 (2002-02-01), Hayashi et al.
patent: 2003/0181994 (2003-09-01), Mizoguchi
patent: 2001-175586 (2001-06-01), None
Nghiem Michael
Nixon & Peabody LLP
Oki Electric Industry Co. Ltd.
Pretlow Demetrius R.
Studebaker Donald R.
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