System LSI

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Reexamination Certificate

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07124061

ABSTRACT:
A system LSI is provided which has a function of enabling data of an external device to be correctly read, when high-speed testing is carried out at a clock signal which is higher-speed than that at a time of usual operation. The system LSI has an external terminal for input of a wait signal from a testing device which is connected when high-speed testing is carried out. Moreover, when the wait signal is supplied to an external bus controller, the external bus controller extends an access time to a ROM during a period of time over which the wait signal is supplied.

REFERENCES:
patent: 5740382 (1998-04-01), Woodbridge et al.
patent: 6629258 (2003-09-01), Kotaka
patent: 2002/0019898 (2002-02-01), Hayashi et al.
patent: 2003/0181994 (2003-09-01), Mizoguchi
patent: 2001-175586 (2001-06-01), None

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